Metasurface Optical Characterization Using Quadriwave Lateral Shearing Interferometry

An optical metasurface consists of a dense and usually nonuniform layer scattering nanostructures behaving as continuous extremely thin component with predefined phase, transmission reflection profiles. To date, various sorts metasurfaces (metallic, dielectric, Huygens-like, Pancharatman-Berry, etc.) have been introduced to design ultrathin lenses, beam deflectors, holograms, or polarizing interfaces. Their actual efficiencies depend on the ability predict their properties fabricate assemblies billions nanoscale structures macroscopic surfaces. further help improve metasurfaces, precise versatile postcharacterization techniques need be developed. Today, most used characterize rely light intensity measurements. Here, we demonstrate how quadriwave lateral shearing interferometry (QLSI), quantitative phase microscopy technique, can achieve full characterization any kind, it probe local imparted by high sensitivity spatial resolution that reaches diffraction limit. As means illustrate versatility this present measurements two types namely, Pancharatnam-Berry effective-refractive-index results uniform metalenses, deflectors.